| NANOSPEC 3000 |
Nanometrics
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Tabletop Film Thickness Analysis Tool. Nanospec 3000 Is A Low Cost, Film Thickness Measurement System That Utilizes A Modern Small Spot Spectrosco . Product Category: Semiconductor, Sub Category: Lab Equipment |
Refurbished |
1 |
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| AFT 4000 |
Nanometrics
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Nanometrics Aft4000 Film Thickness Measurement Equipment . Product Category: Semiconductor, Sub Category: Metrology And Inspection |
Refurbished |
1 |
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| Nanometrics Nanospec |
Nanometrics
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Nanometrics Nanospec 8300 Film Thickness Measurement System Consisting Of: - Model: Nanospec 8300- Wafer Size: 200mm And 300mm Wafers- Automatic Film . Product Category: Semiconductor, Sub Category: Metrology And Inspection |
Refurbished |
1 |
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| 8000 XSE |
Nanometrics
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Cassette To Cassette Thin Film Measurement System W/ellipsometer 8 Wafer Stage, Operating System - Ibm Os,j.a. Woolham M44 Ellipsometer, Lps-300 . Product Category: Semiconductor, Sub Category: Metrology And Inspection |
Refurbished |
1 |
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| 8000x |
Nanometrics
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Cassette To Cassette Thin Film Measurement System 8 Wafer Stage, Operating System - Ibm Os 75w Light Source, In Line Objectives (e10/.25,40/.55, . Product Category: Semiconductor, Sub Category: Metrology And Inspection |
Refurbished |
1 |
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| CD-50-2 |
Nanometrics
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Critical Dimension Measurement Measurement System To Include: 1 Nanometrics Microscope With Trinocular Head, Isolation Stand, Whk 10x/20l Eyepieces, O . Product Category: Semiconductor, Sub Category: Metrology And Inspection |
Refurbished |
1 |
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| Nanometrics-10445-ID |
Nanometrics
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Thin Film Thickness Measurement System For Transpafilms On 75mm To 150mm Wafers, Measures 14 Standard Film Types Including Photoresists, Polyimid . Product Category: Semiconductor, Sub Category: Metrology And Inspection |
Refurbished |
1 |
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| Nanometrics-10446-ID |
Nanometrics
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Thin Film Thickness Measurement System For Transpafilms On 75mm To 150mm Wafers, Measures 14 Standard Film Types Including Photoresists, Polyimid . Product Category: Semiconductor, Sub Category: Metrology And Inspection |
Refurbished |
1 |
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| Nanometrics-25872-ID |
Nanometrics
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Nanospec 210 Is A Wafer Tester That Has A Film Thickness Measurement System. It Has A 100 Angstrom Resolution, . Product Category: Semiconductor, Sub Category: Semiconductor Test |
Refurbished |
1 |
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| 7500-0926 |
Nanometrics
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Nanometrics 7500-0926 Nanospec Aft 4000 Operations Manual With Software . Product Category: Lab Equipment, Sub Category: General Interest - Misc |
Refurbished |
1 |
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| XLS75 |
Nanometrics
|
Nanometrics 7200-022808 Xenon Source Xls75 Rev.f New Inventory # Conb-8267 Nanometrics Xenon Source Is New Surplus, Removed From Excess Stock . Product Category: Semiconductor, Sub Category: Semiconductor - Misc |
New |
1 |
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| 010-0181 |
Nanometrics
|
Computerized Film Thickness Measurement System. Microspectrophotometer Head Can Measure In The Wavelength Range Of 480 To 790nm. Standard Films Measur . Product Category: Semiconductor, Sub Category: |
Refurbished |
1 |
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| 90139693 |
Nanometrics
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Nanometrics 3000 Thin Film Analyzer |
Refurbished |
2 |
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| 90139694 |
Nanometrics
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Nanometrics 7200-2696 Power Supply Module |
Refurbished |
2 |
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| 90139695 |
Nanometrics
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Nanometrics 7200-9-000032 11-0175r Optical Light Source Mirror Laser |
Refurbished |
2 |
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| 90139696 |
Nanometrics
|
Nanometrics Hamamatsu L2196 |
Refurbished |
2 |
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| 90139697 |
Nanometrics
|
Nanometrics Xls75 Xenon Source |
Refurbished |
2 |
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