Get current pricing for Rudolph Research Auto El, Rudolph Research Auto EL-48323-ID Maximum Wafersize: 150 Mm 633 Nm Wavelength 6in Dia. Quickload Stage Measuring Time 17 To 50 Seconds Sample Stage: Movement X/y . Product Category: Semiconductor, Sub Category: Metrology And Inspection:

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Manufacturer: Rudolph Research Auto El Part number: Rudolph Research Auto EL-48323-ID Description: Maximum Wafersize: 150 Mm 633 Nm Wavelength 6in Dia. Quickload Stage Measuring Time 17 To 50 Seconds Sample Stage: Movement X/y . Product Category: Semiconductor, Sub Category: Metrology And Inspection

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